Aehr Test Systems announced that a new customer has selected its FOX-P test and burn-in system to be used for qualification and production wafer level test and burn-in of their silicon carbide devices for automotive electric vehicles. This new customer, who is a supplier of silicon carbide and gallium nitride semiconductors, selected Aehr‘s FOX solution based on its proven ability to cost-effectively implement their target burn-in and stabilization requirements including 100% traceability that every device on the wafer is properly burned in.
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