Aehr Test Systems has shipped the first order from a major silicon photonics customer for a new high-power configuration of its FOX-XP system for volume production wafer level burn-in and stabilization of next generation silicon photonics integrated circuits. This FOX-XP multi-wafer test and burn-in system is configured to enable cost-effective volume production test of wafers of next-generation photonic ICs, which can require up to two to four times as much power per wafer for test and burn-in and stabilization of the silicon photonics devices, and are targeted for use in the new optical I/O or co-packaged optics market.
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